| VOLUME SIXTEEN | NUMBER TEN | FEBRUARY 2005 | |
Micronet Workshop 2005
Significant Innovations 2004-2005Productivity Design Tools Joins Micronet
Potentia Releases Side Power Management ICs
Events
| Micronet Workshop 2005
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| Significant Innovations 2004-05
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| "Low-voltage, Low-power RF ICs" M. Jamal Deen, McMaster University |
In transceivers, the local oscillator (LO) is one of the most important building blocks used to generate a
reference frequency. With the LO operating most of the time, the voltage-controlled oscillator (VCO) and
frequency doubler (FD) are key components requiring special consideration. VCOs with automatic amplitude
control (AAC) allowing for a fast and reliable startup and a well defined output power level, are studied. Such
VCOs are well suited for frequency-hopping spread spectrum (FHSS) or time division multiple access (TDMA)
applications, where the VCO is periodically activated. The use of a FD allows us to extend the nominal operating
frequency of any VCO. Two VCOs with AAC working at 4 and 7.2GHz and excellent performance in phase noise,
tuning range and power dissipation were demonstrated. A 1V frequency doubler operating in the 1 to 4GHz band with 985mW power
consumption and with excellent 1dB compression
point and input referred phase noise was
also demonstrated. Finally, two mixers operating
at 2GHz with a 0.8V supply using the
MOSFET as a four-terminal device and 2.4GHz
with a 1V supply using a folded architecture
were designed and tested. Both mixers had
excellent performance characteristics and their
power dissipation were 400 and 640 mW respectively.
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| "Enabling the Verification of System-on-Chip Designs"
S. Tahar, Concordia University |
Revolutionary advances in microelectronics systems allow today the integration of processors, memory,
operating system, sensors, networking, etc. on a single chip, known as System-on-Chip (SoC). The SoC
technology, however, requires a design language, or System Level Language (SLL), that can model the
software, the hardware and other physical components. In this regard, SystemC is one of the most relevant SLL
proposals that has become an industry standard, adopted by thousands of users. However, the language is still
in its infancy with plenty of room for improvement and provision of EDA tool support.
Alongside Qualcomm, ST Microelectronics, Intel, Synopsys and other top EDA companies and academic research groups, the Hardware Verification Group (HVG) at Concordia University proposed an innovative approach to enable the verification of SystemC using a combination of different techniques: simulation, model checking, assertion based verification and theorem proving. While most people work on SystemC from a hardware background and approach it from that angle, with a focus pure simulation as verification means, Concordia's HVG is considering the design as one system described in one language, SystemC, that can be analyzed and verified as a whole.
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"Digital System-on-a-Chip Testing" N. Nicolici, McMaster University |
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Manufacture test is a key step in the implementation flow of modern integrated electronic products. With the ongoing shift toward
the core-based system-on-a-chip (SOC) design paradigm, unique test challenges are confronted. This is because SOC design using
reusable intellectual property (IP) cores has triggered novel business models based on IP core providers and system integrators.
Although the IP core reuse reduces the design cycle, the rapid growth in SOC complexity makes test development an implementation
bottleneck due to the increasing number of internal cores that are not directly accessible from the chip's terminals. It is worthy to reuse
the existing test plans for IP cores in future SOCs, but this will impose constraints on IP core integration.
These new SOC test challenges must be solved, while keeping the testing time and volume of test data under control. The focus of the
digital SOC testing project is to better understand the impact of emerging design methods on the test flow, and to develop new embedded
logic architectures and computer-aided design algorithms for test planning, generation and application that can be used for detecting
the faulty components, for speed binning and for discovering the sources of systemic and random failures. This will ultimately improve
screening of fabrication defects at a lower cost, as well as accelerate the manufacturing yield learning.
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| Productivity Design Tools Joins Micronet
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Located in Vancouver, B.C., Productivity Design Tools Inc. is a new affiliate of Micronet R&D.; Founded in July 2004, the company
develops Electronic Design Automation (EDA) software systems to improve the productivity of team-based microelectronic circuit
design. Productivity Design Tools is focused on increasing the automation, abstraction and improving team-based collaboration for
System-on-a-Chip electronics design, by providing innovative solutions and tools for engineers to tie tasks together, such as
documentation, Register Transfer Level (RTL) logic design, embedded software design, functional verification and device validation.
The Technical Contact is Mr. Jeremy Ralph, President, Tel: (604) 739-8534 or E-mail: Jeremy@innovationowl.com |
| Potentia Releases Side Power Management ICs
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Potentia Semiconductor is transforming the way on-board power system architectures are designed and implemented. Its unique
approach comprises PowerCenter, a comprehensive design environment for creating and validating custom power system management
strategies, and a rapidly expanding portfolio of configurable power subsystem controller ICs. Residing on the high-voltage side
(24, 48, or 60V) of the safety isolation barrier, the PS-1000 Series devices continuously monitor primary input voltage, current and
fuse status information and transmit digitised data through the isolated PI-Link interface to the secondary side controller. Via the PS-
2406's I2C interface, this primary side status information is then readily interrogated by a higher-level CPU for analysis. The power
subsystem controller's over-voltage and under-voltage levels, start-up and shut-down thresholds, sequencing delay and trim values
are programmed via the I2C interface or JTAG port, and configuration data is stored in the device's non-volatile on-chip memory. For
more information, please visit http://www.potentiasemi.com/
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| Events
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| Micronet Calendar
(2005) |
MARCH 7-11, 2005, DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE: Location: Munich, Germany, Contact: Sue Menzies, Tel: +44 131 225 2892, Fax: +44 131 225 2925, E-Mail: sue.menzies@ec.u-net.com MARCH 14-16, 2005, 11TH IEEE INT'L SYMPOSIUM ON ASYNCHRONOUS CIRCUITS AND SYSTEMS: Location: New York, NY, Contact: Jose A. Tierno, Tel: (914) 945-2499, Fax: (914) 945-1974, E-Mail: tierno@us.ibm.com MARCH 28-30, 2005, 6TH INT'L SYMPOSIUM ON QUALITY ELECTRONIC DESIGN: Location: San Jose, CA, Contact: Dr. Ali Iranmanesh, Tel: (650) 868-8844, Fax: (650) 565-8383, E-Mail: alii@isqed.org
APRIL 2-3, 2005, 7TH INT'L WORKSHOP ON SYSTEM LEVEL INTERCONNECT PREDICTION: Location: San Francisco, CA, Contact: Dr. Dennis Sylvester, Tel: (734) 615-8783, Fax: (734) 763-9324, E-Mail: dennis@eecs.umich.edu APRIL 4-7, 2005, IEEE INT'L CONFERENCE ON MICROELECTRONIC TEST STRUCTURES: Location: Leuven, Belgium, Contact: Danielle Vermetten, Tel: +32-16-321-077, Fax: +32-16-321-975, E-Mail: icmts2005@esat.kuleuven.ac.be |
APRIL 17-19, 2005, 2005 GREAT LAKES SYMPOSIUM ON VLSI: Location: Chicago, Illinois, Contact: James Stine, E-Mail: jstine@ece.iit.edu APRIL 17-20, 2005, IEEE SYMPOSIUM ON FIELD PROGRAMMABLE CUSTOM COMPUTING MACHINES: Location: Napa Valley, CA, Contact: Jeffrey Arnold, Tel: (858) 547-9257, Fax: (858) 547-9010, E-Mail: jmarnold@ieee.org APRIL 20-22, 2005, COOL CHIPS VIII: Location: Yokohama, Japan, Contact: Prof. Tadao Nakamura, Tel: +81 22 217 7010, Fax: +81 22 217 7011, E-Mail: nakamura@archi.is.tohoku.ac.jp APRIL 25-29, 2005, IEEE INTÍL SYMPOSIUM ON VLSI TECHNOLOGY AND THE IEEE INTÍL SYMPOSIUM ON VLSI DESIGN, AUTOMATION AND TEST: Location: Hsinchu, Taiwan, Contact: Stacey Hsieh, Tel: +886- 3-591-3478, Fax: +886-3-582-0221, E-Mail: vlsitsa@itri.org.tw
MAY 1-4, 2005, CANADIAN CONFERENCE ON ELECTRICAL AND COMPUTER ENGINEERING: Location: Saskatoon, Saskatchewan, Contact: Prof. Denard Lynch, Tel: (306) 966-5473, Fax: (306) 966-5407, E-Mail: ccece05@ieee.org
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FORMAL METHODS AND MODELS FOR CODESIGN, VERONA, ITALY INTÍL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES, TOKYO, JAPAN 15TH INTÍL CONFERENCE ON FIELD PROGRAMMABLE LOGIC AND APPLICATIONS, TAMPERE, FINLAND IEEE BIPOLAR/BICMOS CIRCUITS AND TECHNOLOGY MEETING, SANTA BARBARA, CA IFIP VLSI-SOC 2005, PERTH, WESTERN AUSTRALIA 12TH CANADIAN SEMICONDUCTOR TECHNOLOGY CONFERENCE, OTTAWA, ONT. |
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